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Figure 5
Verification of the indexing for all the ROIs of the synthetic single crystal. The best and two less well matched solutions are chosen for each ROI and characterized with respect to their disorientation to the true orientation of the single crystal. Stronger disorientation indicates poorer indexing. Stronger scatter indicates less robust indexing. The results confirm that it is possible to index robustly for up to σz = 0.25 Å, σx = σy = 2σz displacement (standard deviation).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 5| October 2021| Pages 1490-1508
https://doi.org/10.1107/S1600576721008578
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