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Figure 11
Aberrations in the equatorial plane of a diffractometer, assuming a secondary radius of 217.5 mm and a slit width (either receiving slit or size of the source) and a specimen tilt of 0.1 mm, as a function of diffraction angle 2θ.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 6| December 2021| Pages 1811-1831
https://doi.org/10.1107/S1600576721009183
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