view article
Figure 2
A Huygens-like description of a scattering experiment. When an incoming beam of wavelength λ is shone on a sample, each material point hit by it becomes the source of an isotropic secondary wave of identical wavelength. The intensity measured on a detector at any given angle θ results from the interference of all the secondary waves.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 6| December 2021| Pages 1832-1843
https://doi.org/10.1107/S1600576721010293
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS