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Figure 4
NR and sld/solvent volume fraction profiles for PS nanoparticle islands at the Si/D2O interface. Full lines represent Si/D2O and dashed lines Si/nanoparticles/D2O profiles.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 6| December 2021| Pages 1857-1866
https://doi.org/10.1107/S1600576721009262
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