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Figure 3
Schematics highlighting potential measuring depths (a) using different non-destructive diffraction methods [recompiled from the work of Denks (2008BB32)] and (b) based on the AD and ED measurements using laboratory equipment only. In the case of the sin2ψ evaluation procedure, stepwise layer removal was realized by electropolishing.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 6| December 2021| Pages 1793-1798
https://doi.org/10.1107/S1600576721010335
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