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Figure 2
Neutron reflectivity of an SiO2 thin film on a sample substrate mounted in a liquid cell such that γ = 0°. The liquid reservoir contained either (a) D2O or (b) H2O. Measurements were performed with the MAGIK reflectometer with (λf = 5 Å) and without (all λf) energy-analyzed detection. Solid lines show the results of optimizing the experimental data to a single thin-film model (Qz > 0.25 Å−1 data are excluded for data collected without energy analysis). Insets show individual intensity-normalized specular (spec) and background (bkg+ and bkg−) intensities. Shaded areas are plotted on a linear scale. Error bars represent 68% confidence intervals of the reduced data.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 1| February 2022| Pages 58-66
https://doi.org/10.1107/S1600576721011924
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