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![[Figure 3]](ge5108fig3mag.jpg)
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Figure 3
Observation of a spurious background peak (spurion). (a) High-Qz neutron reflectivity of a rough thin film on a sample substrate mounted in air with γ = 0°. Measurements of the individual normalized specular (spec) and background (bkg+ and bkg−) intensities were performed with the MAGIK reflectometer with (λf = 5 Å) and without (all λf) energy-analyzed detection. The spurion peak is at Qz = 0.38 Å−1. Asterisks indicate regions where the background measurements are significantly higher than the specular signal. These features are not observed when the energy analyzer selects λf = 5 Å neutrons. Error bars represent 68% confidence intervals of the reduced data. (b) Detector (transverse) scans across the spurion peak in the specular condition (orange diamonds) and at off-specular positions (blue circles and green squares). The peak is not observed when the energy analyzer selects λf = 5 Å neutrons. Error bars represent 68% confidence intervals of the reduced data. (c) A color map showing the spurion ridge measured through the center of a large silicon block at γ = 0°. The solid line represents the specular ridge. Dashed lines show the positions of background measurements, and the black points show where the spurion is observed in the background intensities. The dashed–dotted line is a linear fit through the observed spurion peak locations from the thin-film sample in panels (a), (b) and corresponds well to the spurion ridge. Error bars represent the 68% confidence interval of the spurion peak location. |
![[Figure 3]](ge5108fig3.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
