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Figure 6
Background improvements from employing energy-analyzed detection, calculated from the data in Fig. 2[link]. (a) The ratio of measured intensity-normalized background levels with the analyzer out and in. This ratio is equivalent to the ratio of signal-to-background ratios in the two conditions. (b) The fractional background reduction is a measure of how much scattering arises from inelastic processes in each material. Uncertainty (particularly in Si) arises from the very low count rates and can be estimated from the variation in neighboring points.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 1| February 2022| Pages 58-66
https://doi.org/10.1107/S1600576721011924
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