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Figure 1
Neutron powder diffraction data of silicon powder in a quartz glass tube with an inner diameter of 4 mm and a wall thickness of 0.25 mm (5 ≤ 2θ ≤ 140°, normalized to have the same maximum intensity as the strongest reflection, 5 min measurement time; NUMOR 975353; https://doi.org/10.5291/ILL-DATA.5-24-605) (top) and in a type-III gas-pressure cell with a sapphire single-crystal crucible as sample holder with an inner diameter of 6 mm and a wall thickness of 1 mm (parasitic reflection from the sample environment marked with *, 5 ≤ 2θ ≤ 140°, 10 min measurement time; NUMOR 178819; https://doi.org/10.5291/ILL-DATA.5-24-639) (bottom). (NUMOR is the internal raw data labelling of the ILL, Grenoble, France.)

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 1| February 2022| Pages 67-73
https://doi.org/10.1107/S1600576721012048
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