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Figure 6
False-colour plot of an ω scan of silicon powder in an aluminium crucible performed on D20 at ILL in 1° steps of ω and with 60 s data accumulation per ω position. Highest intensity in red, lowest intensity in blue, parasitic reflection from the sample environment marked with * (left). Relative intensities of the silicon 111 reflection as a function of ω (middle) and reflection/background ratio as a function of ω (right). (NUMOR 138794; https://doi.org/10.5291/ILL-DATA.5-24-621).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 1| February 2022| Pages 67-73
https://doi.org/10.1107/S1600576721012048
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