Figure 2
Calculated XRD patterns for C-(A)-S-H featuring isolated layers (a), turbostratically disordered layers (11.5 Å layer-to-layer distance) (b) and fibrils (c), (d). The simulations account for a variable divergence slit, an isotropic crystallite size of 30 nm and b = 3.675 Å. The Ca/Si ratio was kept at 1.0 (a)–(c). A non-physical diffraction contribution at low 2θ was removed (b)–(d). |