Laboratory time-resolved X-ray diffractometry for in situ studies of crystalline materials under uniaxial compression and vibration

Akkuratov, V.; Blagov, A.; Eliovich, Y.; Targonskii, A.; Pisarevsky, Y.; Protsenko, A.; Shishkov, V.; Kovalchuk, M.

doi:10.1107/S160057672101236X

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 8
(a) RSM of a quartz crystal without vibrational load. (b), (c) RSMs of a quartz crystal under vibrational load induced by the electric field with different amplitudes: 30 V (b) and 45 V (c).

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 55| Part 1| February 2022| Pages 80-89

https://doi.org/10.1107/S160057672101236X

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