Neural network analysis of neutron and X-ray reflectivity data: automated analysis using mlreflect, experimental errors and feature engineering

Greco, A.; Starostin, V.; Edel, E.; Munteanu, V.; Rußegger, N.; Dax, I.; Shen, C.; Bertram, F.; Hinderhofer, A.; Gerlach, A.; Schreiber, F.

doi:10.1107/S1600576722002230

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 2
Ground truth distribution of the three sample parameters, (a) thickness, (b) roughness and (c) SLD, within the experimental test set of 242 XRR curves. The parameters were obtained by a conventional LMS fit.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 55| Part 2| April 2022| Pages 362-369

https://doi.org/10.1107/S1600576722002230

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page