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Figure 11
PXRD patterns and Rietveld refinement results of (a) the ball-milled and spray-dried LNMFTO spinel and (b) the sample calcined at 1053 K for 2 h, with a square-root scale to emphasize the low-intensity regions. The observed intensity (black crosses), the calculated intensity (red line) and the difference (blue line) are shown. Upper tic marks refer to the spinel phase whereas lower tics correspond to the cubic (a) or layered (b) impurity phase. The left insets show the domain-size distributions with the corresponding mean sizes indicated as vertical lines.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 3| June 2022| Pages 503-514
https://doi.org/10.1107/S1600576722003089
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