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Figure 4
Instrumental resolution for the area-detector diffraction setup with a sample-to-detector distance of 0.7 m, sample dimensions of 0.35 mm and an active detector thickness of 100 µm. The convolution according to equation (2)[link], together with the individual contributions, are plotted for detector angles [\overline {2\theta }] = 12, 22, 32 and 42°. A divergence of 0.3 mrad was assumed for the primary X-ray beam. The wavelength dispersion is given by Δλ = 2Γtan(θ)/E0(180/π) (2θ), where Γ and E0 are the lifetime broadening and the peak emission energy in eV (Cheary et al., 2004BB5), respectively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 3| June 2022| Pages 503-514
https://doi.org/10.1107/S1600576722003089
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