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Figure 5
Comparison of PXRD patterns of an empty PLA sample holder (blue) and β-Na[FeO2] measured on a PLA sample holder (black) and on a silicon single-crystal disc (green). The red dashed line highlights the most intense PLA reflection, which is also visible in the black diffractogram. Diffractograms were measured with Cu Kα radiation (1.5406 Å) at 293 K.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 3| June 2022| Pages 686-692
https://doi.org/10.1107/S160057672200293X
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