Classification of diffraction patterns using a convolutional neural network in single-particle-imaging experiments performed at X-ray free-electron lasers

Assalauova, D.; Ignatenko, A.; Isensee, F.; Trofimova, D.; Vartanyants, I.A.

doi:10.1107/S1600576722002667

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 4
PSD functions for the different data sets. (a) PSD functions for the MaxF1 data selection. (b) PSD functions for the moreSH data selection. Blue dashed line – the whole selection, orange line – selection with size filtering applied, green dashed line – selection with the EM algorithm applied, red line – selection with the EM algorithm and size filtering applied. Both panels (a) and (b) contain the PSD functions of the D_M (puple line) and D_EM (brown line) selections. In the legend, the number of diffraction patterns for each selection is shown in brackets.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 55| Part 3| June 2022| Pages 444-454

https://doi.org/10.1107/S1600576722002667

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