Classification of diffraction patterns using a convolutional neural network in single-particle-imaging experiments performed at X-ray free-electron lasers

Assalauova, D.; Ignatenko, A.; Isensee, F.; Trofimova, D.; Vartanyants, I.A.

doi:10.1107/S1600576722002667

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 6
Reciprocal space representation for the MaxF1 selection with the EM algorithm and size filtering applied. (a) 3D intensity distribution of the virus in reciprocal space after background subtraction. (b) 2D cut of the distribution. All diffraction patterns are shown in logarithmic scale. The black scale bar denotes 0.5 nm⁻¹.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 55| Part 3| June 2022| Pages 444-454

https://doi.org/10.1107/S1600576722002667

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