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Figure 2
A schematic diagram of the setup in the vicinity of the sample interaction region on the SPB/SFX beamline. The optical side microscope camera (Oxford Instruments Andor Zyla 5.5sCMOS) is positioned perpendicularly with respect to the optical axis, 337 mm from the interaction region, and records images at a rate of 10 Hz to match the frequency of pulse trains arriving from the source. Not shown is the local vacuum enclosure around the nozzle.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 4| August 2022| Pages 944-952
https://doi.org/10.1107/S1600576722005891
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