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Figure 1
(a), (b) Illustrations of the angle correction, showing definitions of the various parameters used. (c) A comparison between an uncorrected reflectivity curve R of a planar layer (30 nm D2O layer in air, interfacial roughness σ = 0.3 nm, black line) and the same curve of a spherical cap taking the angle correction RP(Θ) (red line) into account. For better comparability with the uncorrected reflectivity curve, the maximum of the angle-corrected reflectivity curve is rescaled to 1.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 4| August 2022| Pages 758-768
https://doi.org/10.1107/S1600576722004691
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