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Figure 13
Calculated model specular neutron reflectivity curves about the effective critical angle for a 10 + 10 = 20 µm patterned film repeat (Ni stripes 950 Å thick) with the neutron wavevector perpendicular to the Ni stripes at relatively high (7.0 × 10−5 rad, left plot) and low (1.5 × 10−3 rad, right plot) instrumental beam angular resolution, for different values of ΔrT. The glancing angular dependence of the projection given by equation (10)[link], i.e. ΔrT = Lsinθ, was explicitly taken into account. Despite the marked difference in instrumental angular beam divergence, the transverse extent of uniform phase of a neutron packet wavefront has a clearly distinguishable effect on the specular reflectivity in the critical angle region in both cases.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 4| August 2022| Pages 787-812
https://doi.org/10.1107/S160057672200440X
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