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Figure 10
Asymmetric (115) RSMs of the individual SiGe microcrystal containing MQWs recorded during a nanodiffraction experiment at the ESRF and projected at two perpendicular directions of the incidence plane for (a) φ = 0° and (b) φ = 90°. (c) A perspective view of the 3D asymmetric (115) RSM reconstructed from a series of scans with a 2D detector using a nanofocused synchrotron beam placed in the middle of the microcrystal. The red arrows show projection views of the maps in panels (a) and (b).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 4| August 2022| Pages 823-836
https://doi.org/10.1107/S1600576722004885
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