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Figure 11
(a), (b) Sketches showing the microcrystal profile with its structure and the most likely positions of the material responsible for particular diffraction peaks, (a) parallel and (b) perpendicular to the miscut. (c), (d) Symmetric high-resolution (004) RSMs recorded under two perpendicular azimuths, (c) 0° parallel to the miscut and (d) 90° perpendicular to the miscut. The circles around the peaks in the RSMs are roughly associated with the positions in the sketches in panels (a) and (b) marked by circles of the same colour.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 4| August 2022| Pages 823-836
https://doi.org/10.1107/S1600576722004885
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