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![[Figure 2]](nb5319fig2mag.jpg)
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Figure 2
Symmetric (004) RSMs for (a), (b) sample SIGE40 and (c), (d) sample SIGE100, together with line cuts along the Qz axis [panels (b) and (d) on a logarithmic scale and their insets on a linear scale] and along the Qx axis [insets in panels (a) and (c) on a linear scale]. For sample SIGE40 a Ge peak (red) is shown together with the Si peak (blue). Note that in the inset in panel (a) the Si peak position has been shifted by ΔQx = −0.165 towards the Ge peak and its intensity magnified by a factor of 50 in order to make the Si and Ge peaks comparable. For sample SIGE100, the Si peak (blue) was not detected in the high-resolution setup due to high absorption in the 100 µm Ge microcrystals. |
![[Figure 2]](nb5319fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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