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Figure 3
(a), (c) Symmetric (004) and (b), (d) asymmetric (115) RSMs of (a), (b) sample SIGE40 and (c), (d) sample SIGE100, showing the side maxima along the 〈111〉 directions for both samples and along the 〈113〉 directions for SIGE40 coming from crystal facets on top of the microcrystals, illustrated in the SEM images in the insets of panels (b) and (d). The lateral maxima positions are determined by streak deviation and by ΔQz distance from the main central peak.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 4| August 2022| Pages 823-836
https://doi.org/10.1107/S1600576722004885
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