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Figure 3
A fit (red dashed line) produced by RootProf using the MultiFit algorithm during SMRA on sample SA1 of data set D1. The pattern (black continuous line) has been pre-processed as reported in Table 3[link].

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 4| August 2022| Pages 837-850
https://doi.org/10.1107/S1600576722004708
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