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Figure 6
(a) EBSD IPF-Z map of tungsten, with a black box marking the approximate area scanned during Laue diffraction; (b) recorded Laue image from the scan region centre; (c) Laue image in scattering angle space (the spot size is proportional to the intensity); (d) NN indexing of polycrystals in a Laue image (ten crystals of W are indexed); (e) reconstructed IPF-Z map (pixel size: 1 × 2.5 µm) of the highest matching score for a W crystal in the scanned region along with all the indexed orientations presented in an IPF; (f) principal deviatoric ɛ22 (tensile direction) strain component.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 4| August 2022| Pages 737-750
https://doi.org/10.1107/S1600576722004198
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