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Figure 4
Two-dimensional multiplot of the calculated (upper part) and experimental (bottom part) profiles are displayed. In (a) we see an offset between the data and the fit, as well as `waviness' in the experimental profile, which is corrected in (b) by accounting for both centring and elliptical errors. (b) has been plotted just after implementing the corrections and these refer to the SA aperture 200 µm–CL 1080 mm combination.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 4| August 2022| Pages 953-965
https://doi.org/10.1107/S1600576722006367
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