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Figure 8
Pattern-matching (Le Bail) fitting of the EPD collected using the SA aperture 40 µm–CL 1080 mm combination. Reliability factors are relatively higher for the EPD analyses for the 40 µm SA aperture due to the limited number of selected scattering domains. Y axis: sqrt(intensity); X axis: Q (Å)−1.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 4| August 2022| Pages 953-965
https://doi.org/10.1107/S1600576722006367
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