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Figure 3
EBSD results acquired at ×250 and their analysis: (a) EBSD orientation map (IPF-Y; parallel to the loading direction) acquired on the grip; (b) EBSD map acquired on the gauge of the sample tested at 21 MPa; (c) EBSD map acquired on the gauge of the sample tested at 29 MPa. (d) KAM-angle map of the grip. (e) KAM-angle map at 21 MPa. (f) KAM-angle map at 29 MPa. (g) KAM-angle histograms and corresponding log-normal fits.

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APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
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