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Figure 9
EBSD orientation map at ×2000 of (a) the grip (extruded+annealed condition) and (b) the gauge region of the sample tested at 29 MPa; (c) and (d) are the respective KAM maps; and (e) and (f) are the corresponding KAM histograms of each individual grain.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 4| August 2022| Pages 860-869
https://doi.org/10.1107/S1600576722005209
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