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Figure 2
X-ray diffraction imaging of the crack front in (a) the silicon [110] strip, (b) the silicon [100] strip and (c) the full 300 mm silicon wafer assembly. The time t0 indicates the entry time of the crack front in the field of view. The scale bar is 10 mm.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 4| August 2022| Pages 911-918
https://doi.org/10.1107/S1600576722006537
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