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Figure 3
(Top) A single image of all the maximum intensities seen by the camera for the different strip samples and full 300 mm wafer assembly. The centre of the X-ray illuminated area is represented by a red cross and the orange line indicates the position of the line profile extracted below. (Middle) A line profile perpendicular to the crack front. Each peak is due to a single bunch. Space-wise, the exact location of each peak is obtained by a Gaussian fit and indicated by a green triangle. Time-wise, each bunch is 704 ns after the previous one. (Bottom) The evolution of crack front velocity in the X-ray illuminated area, as calculated from the peaks' space–time positions.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 4| August 2022| Pages 911-918
https://doi.org/10.1107/S1600576722006537
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