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Figure 1
Experimental setup showing on top the CCD camera that intercepts diffraction peaks and its (X, Y, Z) basis. The sample is held by the flexion machine, schematically represented by its load and support pins, the ensemble being rotated 40° around X. The X-ray beam impacts along the cross-section profile situated in the tensile zone at the opposite side of the load pin. The sample (aa, bb, cc) basis is also shown, with cc being the [211] growth direction, equivalent to X. Direction bb corresponds to the [011] direction since the cleaved surface is perpendicular to the interface, while the flexural stress is applied along the direction aa, corresponding to [111].

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 5| October 2022| Pages 1297-1304
https://doi.org/10.1107/S1600576722008184
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