view article
Figure 5
(a) A schematic illustration of the experiments, and images of the powder and of a part of a grain obtained by scanning and transmission electron microscopies, respectively; (b) a 2D SAXS pattern of the isolated grains; (c) an azimuthally averaged 1D SAXS pattern of the isolated grains; and (d) a selected sector-averaged (±1°) 1D SAXS profile of the isolated grain and the related simulated scattering curve of a rectangular cuboidal grain. The edge lengths are A = 0.2 µm, B = 3.2 µm and C = 3.2 µm.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 5| October 2022| Pages 1154-1163
https://doi.org/10.1107/S1600576722006987
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS