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Figure 4
Reciprocal space representing SC-XRD data from a sample of basalt: (a) all reflections; (b) reflections of group 1 as found by the DAFi program; (c) reflections of group 1 extended by CrysAlisPro software.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 5| October 2022| Pages 1383-1391
https://doi.org/10.1107/S1600576722008081
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