Indexing of superimposed Laue diffraction patterns using a dictionary–branch–bound approach

Seret, A.; Gao, W.; Juul Jensen, D.; Godfrey, A.; Zhang, Y.

doi:10.1107/S1600576722006021

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 12
The angular uncertainty on the experimental unitary vector of the diffracted beam $[ {\delta}^*_{e}]$ calculated by considering both (i) the distance ∥EP∥ from the emission point E in the sample to the detector and (ii) the uncertainty Δ_d in the detected spot position on the detector assuming that the true spot position is in the pixel window centred on the pixel where the detected spot position lies.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 55| Part 5| October 2022| Pages 1085-1096

https://doi.org/10.1107/S1600576722006021

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