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Figure 7
The effect of noise on the simulated diffraction peaks, II. (a) The average error in the CoM positions of simulated diffraction peaks on the virtual detector (i.e. detector CoMy, detector CoMz and CoMω angle) with respect to signal-to-noise variation. For clarity, the CoMy and CoMω curves are plotted with offsets of 0.5 µm and 0.1°, respectively. (b) The relative errors in the number of detector pixels per peak (i.e. the cumulative area of the observed intensity in pixel units) and in the integrated intensities of the harvested peaks with respect to signal-to-noise variation. The signal-to-noise level is expressed by the parameter β (see text).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 5| October 2022| Pages 1125-1138
https://doi.org/10.1107/S1600576722007361
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