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Figure 1
(a) Dewetted Fe–Ni alloy microcrystals on a sapphire substrate. (b) Fe–Ni microcrystal 1B is used for the computation of strain and rotation tensors. (c) The EDX spectrum for crystal 2B on the substrate, which is similar across all crystals on the substrate. The L lines for the most pronounced elements in the crystal are indicated. The composition excludes the Al and O substrate peaks. The Ga impurity is due to FIB milling around the crystal vicinity (Hofmann et al., 2017bBB20). (d) Central slices of the CXDPs for each reflection, measured for crystal 1B.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 5| October 2022| Pages 1184-1195
https://doi.org/10.1107/S1600576722007646
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