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Figure 8
Images, taken with the 113 reflection of transistor Q3 at (a) 1.4 W and (b) 2.08 W. The region of contrast close to the chip edge, at the bottom left adjacent to pin 9, is an artefact on the camera. It does not show strongly in Fig. 3[link] owing to the higher contrast of the surrounding features in the 220 reflection.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 5| October 2022| Pages 1139-1146
https://doi.org/10.1107/S1600576722007142
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