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Figure 9
Length of total die image, measured along its left-hand edge, in the projected direction of the diffraction vector as a function of the external temperature of the LM3046 package when power is dissipated in a single transistor.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 5| October 2022| Pages 1139-1146
https://doi.org/10.1107/S1600576722007142
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