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Figure 2
Combined Rietveld refinement of CoFe2O4 diffraction patterns obtained using neutrons (DMC), Co and Cu as radiation sources. The data are shown as red circles, the refined model as a black line and the residual as a blue line. Weighted profile, Rwp, and Bragg, RBragg, R factors are indicated for each diffraction pattern. For visualization purposes, a specified frequency of data points has been selected: frequencies of 3, 20 and 10 points have been drawn for DMC, Co Kα and Cu Kα patterns, respectively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 5| October 2022| Pages 1336-1350
https://doi.org/10.1107/S1600576722008123
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