view article
Figure 12
The FWHM widths at 3 K of the diffraction spots in the qx and qy directions versus field. These widths are mainly dominated by the in-plane resolution of the instrument – marked by dashed lines – so they only set a low limit on the VL perfection. Dashed lines indicate the resolution of the HFM/EXED instrument.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 5| October 2022| Pages 1314-1323
https://doi.org/10.1107/S1600576722008226
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS