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Figure 5
(a) Powder XRD diffractograms of CaWO4 of a single scan and of averaged diffractograms over 2, 4, 8, 16 and 32 scans (with each scan having been recorded for 10 min exposure time). (b) Si(331) reflection with a single scan (Rp = 7.1%, [R_{\rm p}'] = 32.1%) and 32 scans (Rp = 4.3%, [R_{\rm p}'] = 22.2%) averaged (solid black line) and their fitted data (red points). (c) FWHM values for the Si(331) reflection with various averaged scans up to 32.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 5| October 2022| Pages 1097-1103
https://doi.org/10.1107/S160057672200677X
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