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![[Figure 2]](yr5086fig2mag.jpg)
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Figure 2
Schematic representation of the Scatman's MSFT approach. In (a), the sample as a whole is defined by its scattering strength ρ, which depends on the spatial distribution of the complex refractive index n. In (b), the sample is split into S slices, where, for each slice s, the scattering density ![[\tilde{\rho}_{s}]](teximages/yr5086fi12.svg) is determined by the slice's optical properties. In (c), the scattered far field is computed for each slice s. In the last step (d), the scattering of the slices is summed with a phase correction and subsequently squared to simulate the recorded diffraction pattern on the detector. For clarity of presentation, (c) only shows the scattering signal's squared amplitude for every slice, while the actual scattered wavefield is still a complex function at this point. |
![[Figure 2]](yr5086fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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