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Figure 2
(a) Neutron diffraction patterns and Rietveld refinements, and (b) the PDF refinements for Si powder sealed in the single-crystal sapphire, in situ vanadium and ex situ vanadium sample containers. Rietveld refinement results: observed (circles), calculated (line) and residual (line below the vertical bars) diffraction profiles. PDF refinement results: observed (circles), calculated (line) and residual PDF profiles.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 55| Part 6| December 2022| Pages 1631-1639
https://doi.org/10.1107/S1600576722010561
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