Improving data quality for three-dimensional electron diffraction by a post-column energy filter and a new crystal tracking method

Yang, T.; Xu, H.; Zou, X.

doi:10.1107/S1600576722009633

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
Schematics of energy-filtered 3D ED in (a) STEM mode (non-ray diagram) and (b) TEM mode (ray diagram). In STEM mode, crystal tracking using a STEM-HAADF image stream can be activated.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 55| Part 6| December 2022| Pages 1583-1591

https://doi.org/10.1107/S1600576722009633

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