Automatic bad-pixel mask maker for X-ray pixel detectors with application to serial crystallography

Sadri, A.; Hadian-Jazi, M.; Yefanov, O.; Galchenkova, M.; Kirkwood, H.; Mills, G.; Sikorski, M.; Letrun, R.; de Wijn, R.; Vakili, M.; Oberthuer, D.; Komadina, D.; Brehm, W.; Mancuso, A.P.; Carnis, J.; Gelisio, L.; Chapman, H.N.

doi:10.1107/S1600576722009815

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 7
Effect of RMM on the self-consistency statistics (a) CC*, (b) CC_1/2, (c) R_split (%) and (d) SNR, using the RPF peak finder for the detector CSPAD 2.5-M. Green curves show the results when applying the proposed bad-pixel mask, while the red curves show the results when using the bad-pixel mask provided with the data set.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 55| Part 6| December 2022| Pages 1549-1561

https://doi.org/10.1107/S1600576722009815

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