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![[Figure 2]](jo5077fig2mag.jpg)
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Figure 2
The neural network architecture for extracting thin-film parameters from reflectivity data as demonstrated by Greco et al. (2022  ). |
![[Figure 2]](jo5077fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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Figure 2
The neural network architecture for extracting thin-film parameters from reflectivity data as demonstrated by Greco et al. (2022 ). |
| JOURNAL OF APPLIED CRYSTALLOGRAPHY |
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