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Figure 5
Illustration of a single simulated diffraction peak (right) for an elliptical grain meshed by 3283 elements (left). The difference between ray tracing driven by the scattering unit centroids (A) can be compared with ray tracing driven by the detector pixels grid (B).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 1| February 2023| Pages 282-292
https://doi.org/10.1107/S1600576722011001
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